000 00401nam a22001577a 4500
005 20251108172411.0
008 250721s1981 xx 000 0 eng d
082 1 4 _a621.38152/REL
100 1 _aM . J, HOWES
245 1 0 _aRELIIBILITY AND DEGRADATION :
_bDEMICCDU /
264 1 _aNEW YORK :
_bJHON WILEY,
_c1981.
300 _a444P
650 1 7 _aSEMICONDUTORS
942 _2ddc
_cBK
999 _c78311
_d78311